Note that this testing document does not have anything to do with testing that is done before committing to svn. It is a test document for released code. Pre-commit testing is done mostly by the developer who has written the change. Release testing is done on code believed to be stable, often a couple of weeks old, and not by the developers, but rather users and community testers who has the requisite hardware and test setup. Also the testing can take place over an extended period of time.
All of the above makes it imperative that there can be no doubt about *which* code is tested and thus all tests refer to committed code by subversion number.
If you need the latest released and tested version, look for binary snapshots of OpenOCD. Worst case look up the test result table below for the features that are important to you and extract and build the version that has the right cocktail of working features for you. You can also work with the community to address the problems you are seing. Testing work and bug reports are highly appreciated.
The OpenOCD community may decide to create release branches. If this happens, then a branch will be created from OpenOCD trunk. The particular version to create that branch might be an older version rather than the latest and greatest. Fixes are then ported to that release branch from OpenOCD trunk.
|Passed version||The latest version on which the test is known to pass|
|Broken version||The latest version on which the test is known to fail. n/a when older than passed version.|
|ID||A unqiue ID to refer to a test. The unique numbers are maintained in this file.|
The latest version in which the test is known to have passed is in the table below.
|ID||Synopsis||JTAG device||Passed version||Broken version|
|bdte-ram||str710 ram debugging||JTAGkey||423||n/a|
|bdte-rom||str710 rom debugging||JTAGkey||423||n/a|
|bdte-ram||str912 ram debugging||JTAGkey||423||n/a|
|bdte-rom||str912 rom debugging||JTAGkey||423||n/a|
|bdte-ram||lpc2148 ram debugging||JTAGkey||423||n/a|
|bdte-rom||lpc2148 rom debugging||JTAGkey||423||n/a|
|bdte-ram||lpc2294 ram debugging||JTAGkey||423||n/a|
|bdte-rom||lpc2294 rom debugging||JTAGkey||423||n/a|
|bdte-ram||sam7s256 ram debugging||JTAGkey||423||n/a|
|bdte-rom||sam7s256 rom debugging||JTAGkey||423||n/a|
|bdte-ram||sam7x256 ram debugging||JTAGkey||423||n/a|
|bdte-rom||sam7x256 rom debugging||JTAGkey||423||n/a|
|bdte-ram||at91r40008 ram debugging||JTAGkey||423||n/a|
|ID||Synopsis||Passed version||Broken version|
|jtag4||add new one||n/a||n/a|
The test result is in KB/sec.
|speed2||add new one||n/a||n/a||n/a|
Note that code is never deleted from OpenOCD svn, it remains in svn so if somebody sees a feature removed that they would like kept, they have but to port and fix that feature back up to main trunk. This document can be helpful in this regard in that the latest working version and the known broken version may be listed.
Also new tests should be defined. Note that the code does not have to pass all the tests. In fact it can be helpful to have tests to describe facets that really should be working, but aren't done yet.
This test was made under Eclipse with the Zylin Embedded CDT plugin. For the GDB "Initialize commands" take a look in the examples/<target>/prj/eclipse_ram.gdb file.
Start debugging, the debugger should stop at main. set some breakpoints and "Resume". If the debugger hit a breakpoint check if the "Variables" looks correct. Remove some breakpoints and "Resume" again. If the target is running, use the "Suspend" function and use "Step Into" or "Step Over" through the source. Even open the "Disassembly" view and enable the "Instruction Stepping Mode". Now you can single step through the assembler source. Use "Resume" again to run the program, set a breakpoint while the target is running. Check if you can inspect the variables with the mouse over. Play a little with the target...
This test was made under Eclipse with the Zylin Embedded CDT plugin. For the GDB "Initialize commands" take a look in the examples/<target>/prj/eclipse_rom.gdb file.
Start debugging, the debugger should download and store the program in the flash of the target.
Now you can make some tests like described in the bdte-ram section above too.
For this test a STR710 with external memory was used. The example project can be found under examples/STR710JtagSpeed. Here Eclipse or the arm-elf-gdb can be used to download the test.elf file into the RAM. The result of the GDB can look like:
Loading section .text, size 0x6019c lma 0x62000000
Start address 0x62000040, load size 393628
Transfer rate: 93 KB/sec, 2008 bytes/write.
In this example a speed of 93 KB/sec was reached. The hardware which was used for the test can be found here.