+@node Utility Commands
+@chapter Utility Commands
+@cindex Utility Commands
+
+@section RAM testing
+@cindex RAM testing
+
+There is often a need to stress-test random access memory (RAM) for
+errors. OpenOCD comes with a Tcl implementation of well-known memory
+testing procedures allowing the detection of all sorts of issues with
+electrical wiring, defective chips, PCB layout and other common
+hardware problems.
+
+To use them, you usually need to initialise your RAM controller first;
+consult your SoC's documentation to get the recommended list of
+register operations and translate them to the corresponding
+@command{mww}/@command{mwb} commands.
+
+Load the memory testing functions with
+
+@example
+source [find tools/memtest.tcl]
+@end example
+
+to get access to the following facilities:
+
+@deffn Command {memTestDataBus} address
+Test the data bus wiring in a memory region by performing a walking
+1's test at a fixed address within that region.
+@end deffn
+
+@deffn Command {memTestAddressBus} baseaddress size
+Perform a walking 1's test on the relevant bits of the address and
+check for aliasing. This test will find single-bit address failures
+such as stuck-high, stuck-low, and shorted pins.
+@end deffn
+
+@deffn Command {memTestDevice} baseaddress size
+Test the integrity of a physical memory device by performing an
+increment/decrement test over the entire region. In the process every
+storage bit in the device is tested as zero and as one.
+@end deffn
+
+@deffn Command {runAllMemTests} baseaddress size
+Run all of the above tests over a specified memory region.
+@end deffn
+
+@section Firmware recovery helpers
+@cindex Firmware recovery
+
+OpenOCD includes an easy-to-use script to facilitate mass-market
+devices recovery with JTAG.
+
+For quickstart instructions run:
+@example
+openocd -f tools/firmware-recovery.tcl -c firmware_help
+@end example
+